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高级模拟电路设计深圳站(线下公开课)

授课专家:Marcel Pelgrom教授

价格 ¥ 4500.00
课程介绍

 

2019年4月15日-16日我们将在深圳举办一期高级模拟电路设计课程,授课专家为Marcel Pelgrom教授。

 

因为电路设计很大程度上取决于复现半导体器件参数的能力。 其他相同组件之间的统计变化通常由失配参数描述。 失配会影响模数转换器、I-Q混频器、SRAM、电流镜、运算放大器等的性能。

在这个短期课程中,模拟和数字电路设计人员将学习这些效应和版图问题的基本知识,接下来探讨对性能和电路良率的影响。 本课程将介绍如何计算各种电路中的(随机)偏移以及如何降低不必要的性能和良率损失。 此外,将讨论几种减轻电路和版图不匹配的方法。

本次课程详细大纲:

 

1Random mismatch origins-随机失配来源

 

After an overview of the required statistical tools, this lecture will analyze the origins of mismatch, such as random dopant fluctuations. Understanding and mitigating these effects requires statistical means.

The general mismatch model will be discussed and compared to measurements. The application to the current variation in MOS transistors is analyzed. The relation to technological parameters, Finfet, SOI and design choices is explained.

在概述了所需的统计工具之后,本讲座将分析失配的来源,例如随机掺杂剂波动。理解和减轻这些影响需要统计手段。

接下来将讨论一般的失配模型并与测量结果进行比较。分析MOS晶体管的电流变化的应用。解释技术参数、FinfetSOI和设计选择的关系。

 

2Analyzing mismatch in analog circuits-分析模拟电路中的失配

 

Analog ICs with differential operation are heavily affected by mismatch. In today’s advanced technologies every circuit from SRAM cell to an I-Q mixer must deal with statistical variations.  This lecture deals with handling the statistical effects in circuits, analyzing input referred random offsets and estimating yield.

Also typical analog performance parameters such as: PSSR, CMRR are affected by mismatch.

 

Examples from every day design practice will be shown.

具有差分操作的模拟IC受到失配的严重影响。在今天的先进技术中,从SRAM单元到I-Q混频器的每个电路都必须处理统计变化。本课程涉及如何处理电路中的统计效应,并分析输入参考随机偏移和输出估计。

此外,典型的模拟电路性能参数如:PSSRCMRR也会受到失配的影响。课程将展示日常设计实践的示例。

 

3Application to circuits and yield-电路和良率的优化

 

Examples start with the analysis of a simple differential pair, and are extended to opamps, voltage and current steering DACs, and other analog circuits. Optimization of a bandgap reference circuit is discussed. The theory is also applied to timing chains, ring oscillators, comparators and yield analysis of flash converters.  Options to reduce the effect of mismatch and gradients are discussed. Auto-zero, chopping and calibration are reviewed.

示例从分析简单差分对开始,并扩展到运算放大器,电压和电流舵DAC以及其他模拟电路,讨论带隙参考电路的优化。 该理论还适用于闪存转换器的时序链、环形振荡器、比较器和良率分析。讨论减小失配和梯度影响的方法。 回顾自动归零、斩波和校准等技术。

 

4Layout strategies to reduce offset-减小偏移的版图策略 

 

After an introduction on elementary IC device characteristics and circuit analysis aspects (statistics, spread, fluctuations, parametric gradients), this lecture focuses on the main attention areas of mixed-signal circuit layout, namely electrical design related issues and technology related hazards. The design part discusses topics like IR drop, power supply loops, mirroring of lay-outs,  temperature gradients and design discipline. The technology part focuses on proximity and reticle effects, advanced lithography such as double patterning, layout induced mechanical stress asymmetries, and common centroid layout solutions.  The lecture finishes with a comprehensive set of guidelines.

在介绍了基本IC器件特性和电路分析(统计、扩散、波动、参数梯度)之后,本课程主要关注混合信号电路版图的主要关注领域,即电气设计相关问题和技术的相关危害。设计部分讨论的主题包括IR降、电源回路、版图镜像、温度梯度和设计规程。 技术部分侧重于邻近效应和光罩效应、先进的光刻技术,如双重曝光,布局引起的机械应力不对称,以及常见的质心布局解决方案。课程以一套全面的指导方针完成。

 

线下公开课报名链接:http://www.ictc.org.cn/article/50

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